The laboratory is equipped with a scanning near-interaction microscope (STM/AFM microscope) for studying nanometer-sized molecular structures.

The Scanning Tunneling Microscope (STM) makes it possible to obtain an image of the surface of conductive materials with a resolution capability of the order of a single atom. Obtaining an image of the surface is possible by using the tunneling phenomenon.

The Atomic Force Microscope (AFM) allows viewing the surface topography of non-conductive materials, such as ceramics or plastics. This is possible by using interatomic interaction forces.

Purpose:

  • surface quality assessment: observation of surface micro- and nano-structures
  • surface quality assessment: microhardness
  • surface quality assessment: magnetic or electrical
  • surface wear assessment: observation of micro- and nano-cracks
  • surface wear assessment: study of early corrosion processes
  • surface wear assessment: studies of surface structure change under varying environmental conditions
  • surface wear evaluation: studies of surface abrasion processes

Laboratory menager:

Prof. Jakub Karczewski
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