General area information:
The research topics cover wide range of subjects matter of electronic, optoelectronic and microelectronic systems designed for measurement and diagnostics (also with artificial intelligence), alarm systems, person and product identification, car electronics, monitoring systems, product quality assurance systems, product electronization etc.
It applies to extensive and coherent issues of electronic systems starting from microsystems configured in a single chip (Instrument on a Chip) or on a small layout using programmable circuit like CPLD, FPGA, MEMS, microcontrollers and signal processors, coming through conventional systems, to macrosystems, also distributed systems using computer networks.
In the field of optical measurement techniques, topics cover important optical measurement methods, optical fiber sensors, optical processing of information, holography and information visualization systems.
Research teams topics description:
Department of Metrology and Optoelectronics - Metrology and Electronic Systems team:
The scientific speciality of the Team is computer aided metrology, diagnostics technics and electronic systems design, in particular: micro- and macro- electronic systems design, electronic testing and diagnostics, measurement of noise properties of objects, measurements of distorsions, reliability, electromagnetic compatibility, impedance measurements and spectroscopy, internet telemetry and telediagnostics.
Department of Metrology and Optoelectronics - Optoelectronics team
The research is focused on the application of optoelectronic measurement methods to monitoring technical objects, environment and production processes. Specifically, the topics of our research are: application of optoelectronic measurement methods in science, medicine, industry and ecology, non-destructive evaluation of physical objects using optical methods, colorimetric and spectrophotometric evaluation of materials and light sources, performance of information visualization systems and the systems for virtual reality environments, applications of liquid crystalline materials in measurement techniques, Spectral measurement methods in material and manufacturing process research.
Department of Microelectronic Systems:
Research is focused on: modeling, design, optimization and practical realization of semiconductor devices, modeling, design, optimization and practical realization of analog and digital integrated CMOS circuits, hardware implementation of image processing algorithms, design and hardware implementation of integrated sensor networks in FPGA and ASICs, artificial intelligence, evolutionary algorithms, hand software realization of cryptographic algorithms, techniques of electromagnetic shields in security systems, fuzzy logic systems for the design of VLSI circuits.
Keywords:
electronic testing and diagnostics, computer aided metrology, semiconductor devices, integrated CMOS circuits, electronic system design, optoelectronic measurements, information visualization systems.
