dr inż. Michał Kowalewski | Politechnika Gdańska

A new method of noise generation based on software implementation of a 7-bit LFSR based on a common polynomial PRBS7 using microcontrollers equipped with internal ADCs and DACs and a microcontroller noise generator structure are proposed in the paper. Two software applications implementing the method: written in ANSI C and based on the LUT technique and written in AVR Assembler are also proposed. In the method the ADC results are...

A new solution of a smart microcontroller sensor based on a simple direct sensor-microcontroller interface for technical objects modeled by two-terminal networks and by the Beaunier’s model of anticorrosion coating is proposed. The tested object is stimulated by a square pulse and its time voltage response is sampled four times by the internal ADC of microcontroller. A neural classifier based on measurement data classifies the...

A wireless measurement system based on the Z-Wave standard is presented in this paper. The system is composed of a U SB Z-Stick Gen5 controller connected to a Personal Computer and a Fibaro controller FGRGBWM-441. Operation of the system is controlled by software written in C++ using OpenZWave library. Some metrological aspects of the system are evaluated: accuracy, linearity, resolution and frequency of voltage measurements.

In the paper a new concept of measurement system based on the Z-Wave standard is presented. This standard is dedicated to use mainly in home automation systems, but its properties enable to use it in dispersed measurement systems and support wireless communication between measurement nodes in a mesh-type network. In the paper basic metrological aspects of the Z-Wave standard and an example of impedance measurement system are discussed.

A new approach of self-testing of analog circuits based on fully differential op-amps of mixed-signal systems controlled by microcontrollers is presented. It consists of a measurement procedure and a fault diagnosis procedure. We measure voltage samples of a time response of a tested circuit on a stimulation of a unit step function given at the common-mode reference voltage input of the op-amp. The fault detection and fault localization...